Patent

Domestic Patent
No. Registration No. Title Date of Registration
1 No. 10-1110327 Test socket for semiconductor test Jan. 19, 2012
2 No. 10-1086278 Connector and conductive member Nov. 17, 2011
3 No. 10-1131105 Semiconductor test equipment Mar. 21, 2012
4 No. 10-1193556 PCB-integrated test socket Oct. 16, 2012
5 No. 10-1173606 PCB-integrated test socket Aug. 7, 2012
6 No. 10-1254180 Test socket for semiconductor test Apr. 8, 2013
International Patents
No. Registration No. Title Date of Registration
9 No. 10-1131105 Semiconductor test equipment (Taiwan) Mar. 16, 2014
10 No. 10-1173606 Semiconductor package (Taiwan) Sep. 22, 2014
11 No. 10-1086278 Connector and conductive member (Taiwan) Mar. 21, 2012
Design Patent
No. Registration No. Title Date of Registration
12 No. 10-1086278 Housing for electrical connector Dec. 10, 2012
13 No. 10-1086278 probe pin Nov. 21, 2012